Original upload date: Mon, 13 Feb 2017 01:00:00 GMT
Archive date: Thu, 02 Dec 2021 01:03:14 GMT
Imagine patterning and visualizing silicon at the atomic level, something which, if done successfully, will revolutionize the quantum and classical computing industry. A team of University of Alberta
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scientists has done just that. Part of this process is illustrated here. They have channeled a technique called atomic force microscopy—or AFM—to pattern and image electronic circuits at the atomic level. This is the first time the powerful technique has been applied to atom-scale fabrication and imaging of a silicon surface, notoriously difficult because the act of applying the technique risks damaging the silicon. However, the reward is worth the risk, because this level of control could stimulate the revolution of the technology industry.
Read more about these scientific findings in Nature Communications: http://www.nature.com/articles/ncomms14222
This animation shows the tip and surface atoms' relaxation during DFTB calculations of a part of the image simulation at small tip-surface distance. The bending and rotation of bonds is visible giving a sense of the interactions and atomic relaxations involved. (The animation originally appeared in Nature Communications with the publication of the research findings.)
